Characterization The morphology and size

distribution of the products were characterized by a LEO-1530 field-emission SEM (Carl Zeiss AG, Oberkochen, Germany) with an accelerating voltage of 20.0 kV. Chemical composition of the specimens was analyzed using an EDS as attached on the SEM. Structural quality of the nanowire arrays was evaluated by an X’Pert PRO XRD (PANalytical Instruments, Almelo, Netherlands) with Cu Kα radiation (λ = 1.54056 Å). The PL spectra of the samples were collected on a Hitachi F-7000 fluorescence spectrophotometer (Hitachi, Tokyo, Japan) with an excitation wavelength of 325 nm. Optical reflectance measurements were performed on an Agilent Evofosfamide solubility dmso Cary-5000 UV-vis-NIR spectrophotometer (Agilent Technologies, Sta. Clara, CA, USA). All the measurements were carried out at room temperature in normal conditions. Results and discussion The structural evolution of the as-grown specimens that underwent Ruxolitinib order 30-min chemical etching and 2-h hydrothermal

growth (S30Z2) is presented in the right panels of JNK-IN-8 datasheet Figure 1. It can be seen that after chemical etching in step 1 (Figure 1e), free-standing Si nanowire arrays in a wafer scale are produced on the substrate surface in a vertical alignment. The Si nanowire arrays have a length of about 2.5 μm and a diameter ranging between 30 and 150 nm. The growth rate of the nanowire length is about 1.4 nm/s and almost keeps constant for different durations. The structure, growth rate, and diameter of the Si nanowires are primarily restricted by the components and concentration of etching solution, as corroborated by the following experiments. A layer of ZnO nanoparticles is subsequently deposited on the Si nanowire array in step 2 (Figure 1f). Due to the isotropic characteristic of the sputtering system, the ZnO nanoparticles conformally coat on the nanowires and induce a rough sidewall surface. After hydrothermal growth in step 3 (Figure 1g), branched ZnO nanowires grow hierarchically on the surface of the Si nanowires, which fills up the space between the Si nanowires these and presents a flower shape on each Si nanowire tip for the radial growth.

The heterogeneous nanowire structure is more obvious in the magnified and cross-sectional SEM images in Figure 2. The branched ZnO nanowires grow nearly in the normal direction to the Si nanowire surface. They have a hexagonal cross section and grow along the c axis of the wurtzite crystal. This is also confirmed by the following XRD pattern of the specimen. The distribution of ZnO nanowires seems non-uniform over the Si nanowire surface, which may be due to the non-uniformity of Si nanowire diameters from the chemical etching and the uneven coating of ZnO seed layer from sputtering. The mean diameter of ZnO nanowires is around 35 nm and is almost independent to the site of the Si nanowires. However, the length of ZnO nanowires is strongly dependent on the nanowires’ location.