Methods ZnO/TiO2 multilayers were GS-1101 deposited at 200°C using a BENEQ TFS-200 ALD reactor (Beneq Oy, Vantaa, Finland)
on n-doped Si (100) (ρ = 1 to 10 Ω cm) and quartz substrates. ZnO films were deposited by alternating exposures to diethylzinc (DEZn) and deionized (DI) water, while TiO2 films were prepared using titanium isopropoxide (TTIP) and DI water as precursors. The TTIP and DEZn were held in stainless bubblers at 58°C and 18°C, respectively. The precursors were alternately introduced to the reactor chamber using high-purity N2 (>99.99%) as a carrier gas. An ALD cycle of TiO2 LY333531 molecular weight films consisted of 1.0-s TTIP dosing, 5.0-s N2 purge, 0.5-s DI water dosing, and 5.0-s N2 purge, while for ZnO films, the cycle is 0.5-s DEZn/2.0-s N2/0.5-s DI water/2.0-s N2. A schematic of five sample structures is given in Figure 1. Multilayers were prepared in depositing alternating layers of TiO2 and ZnO. Five samples contain one, two, three, four, and six ZnO/TiO2
bilayers, respectively. Each structure was deposited on Si and quartz substrates, respectively, so ten samples were prepared actually. The nominal film thickness for the multilayer was selleck compound 50 nm. Figure 1 Schematic of physical models of ZnO/TiO 2 nanolaminates grown by ALD. The thicknesses of the multilayer were measured by spectroscopic ellipsometry (Sopra GES5E, SOPRA, Courbevoie, France) where the incident Farnesyltransferase angle was fixed at 75° and the wavelength region from 230 to 900 nm was scanned with 5-nm steps. The optical transmission spectra were obtained using a UV spectrophotometer (UV-3100) in a wavelength range of 200 to 900 nm at room temperature in air. The crystal structures of the films were obtained using an X-ray diffractometer (D8 ADVANCE, Bruker AXS, Inc., Madison, WI, USA) using Cu Kα radiation (40 kV, 40 mA, λ = 1.54056
Å). High-resolution transmission electron microscopy and electron diffraction experiments were performed in a Philips CM200-FEG system operated at 200 kV. The specimens were prepared by mechanical polishing and dimpling, followed by Ar+ ion milling to electron transparency with 4.0-keV beam energy at an angle of 6° using a Gatan precision ion polishing system (Pleasanton, CA, USA). Results and discussion The experimental and fitted ellipsometric spectra of ZnO/TiO2 multilayer thin films were measured using the spectroscopic ellipsometer. For example, the experimental (open symbol) and calculated (solid line) ellipsometric spectra (cosΔ and tanψ) of samples 1 and 2 are presented in Figure 2a,b, respectively. It can be observed that the experimental and fitting curves match very well, with the accuracy of the regression (R 2) greater than 0.998. Table 1 shows the layer thickness of the samples grown on Si substrate. As can be seen, total thicknesses for samples 1 to 5 are 51.14, 48.27, 46.92, 46.56, and 46.